SHARMA, Bal Krishna. SURVEY OF STUCK-AT FAULT MODELS IN VLSI TESTING: METHODS, TOOLS, AND OPTIMIZATION STRATEGIES. Journal of Global Research in Mathematical Archives(JGRMA), [S. l.], v. 12, n. 11, p. 59–66, 2025. DOI: 10.5281/zenodo.17864049. Disponível em: https://jgrma.com/index.php/jgrma/article/view/679. Acesso em: 12 jan. 2026.